Abstract
Thin, single crystal, epitaxial bcc Fe(001) films were grown on Ge(001) surfaces at 150°C. Fe film growth and interface structure were monitored by RHEED. Fe thin film formation was determined by XPS and HRTEM.
Original language | English (US) |
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Pages (from-to) | 1586-1591 |
Number of pages | 6 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 20 |
Issue number | 4 |
DOIs | |
State | Published - Jul 2002 |
Event | Proceedings of the 29th Conference on the Physics and Chemistry of Semiconductor Interfaces - Santa Fe, NM, United States Duration: Jan 6 2002 → Jan 10 2002 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering