TY - GEN
T1 - Growth of Cu(In, Ga)(S, Se)2 films
T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
AU - West, Bradley
AU - Stuckelberger, Michael
AU - Chen, Lei
AU - Lovelett, Robert
AU - Lai, Barry
AU - Maser, Jorg
AU - Shafarman, William
AU - Bertoni, Mariana
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/18
Y1 - 2016/11/18
N2 - In-situ investigations of Cu(In, Ga)(S, Se)2 (CIGS) absorber layers during growth have the potential to provide insight into the origin behind elemental segregation and defect formation at grain boundaries and in grain cores. Our study focuses on CIGS films grown by an industrially relevant precursor reaction process. An in-situ stage developed for these synchrotron studies is used to image the growth of CIGS layers with nanoscale resolution. Utilizing synchrotron based x-ray fluorescence, we are able to rapidly monitor changes in elemental distribution and particle diffusion, with better than 200 nm spatial resolution throughout the 25 minute process. In this work, we highlight some challenges associated with this type of measurements and discuss solutions identified to overcome them.
AB - In-situ investigations of Cu(In, Ga)(S, Se)2 (CIGS) absorber layers during growth have the potential to provide insight into the origin behind elemental segregation and defect formation at grain boundaries and in grain cores. Our study focuses on CIGS films grown by an industrially relevant precursor reaction process. An in-situ stage developed for these synchrotron studies is used to image the growth of CIGS layers with nanoscale resolution. Utilizing synchrotron based x-ray fluorescence, we are able to rapidly monitor changes in elemental distribution and particle diffusion, with better than 200 nm spatial resolution throughout the 25 minute process. In this work, we highlight some challenges associated with this type of measurements and discuss solutions identified to overcome them.
KW - CIGS
KW - XRF
KW - growth
KW - in-situ
KW - synchrotron
UR - http://www.scopus.com/inward/record.url?scp=85003758522&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85003758522&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2016.7749650
DO - 10.1109/PVSC.2016.7749650
M3 - Conference contribution
AN - SCOPUS:85003758522
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 530
EP - 533
BT - 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 5 June 2016 through 10 June 2016
ER -