Fullband Particle-Based Simulation of High-Field Transient Transport in III–V Semiconductors

S. Wigger, M. Saraniti, S. Goodnick, A. Leitenstorfer

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Motivated by recent experimental measurements (A. Leitenstorfer et al., 2000. Physical Review B 61(24): 16642–16652), this work presents the transient analysis of photogenerated electron-hole pairs in GaAs and InP pin diodes (S. M. Sze, 1981. Physics of Semiconductor Devices, 2nd edn., John Wiley) using a fullband particle-based simulator (M. Saraniti and S. Goodnick, 2000. IEEE Transactions on Electron Devices 47(10): 1909–1915). The fullband simulation tool is based on a particle-based technique that has been developed to reduce the computational time required for modeling charge transport phenomena in semiconductors. Excellent agreement is found between experiment and simulation of transient acceleration and velocity overshoot in GaAs and InP pin diodes due the femto-second optical excitation of carriers.

Original languageEnglish (US)
Pages (from-to)475-480
Number of pages6
JournalJournal of Computational Electronics
Volume1
Issue number4
DOIs
StatePublished - Dec 1 2002

Keywords

  • Monte Carlo simulation
  • Tera-Hertz radiation
  • high-field transport

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Modeling and Simulation
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Fullband Particle-Based Simulation of High-Field Transient Transport in III–V Semiconductors'. Together they form a unique fingerprint.

Cite this