Abstract
We report new advancements in the determination and high-resolution structural analysis of beam-sensitive metal organic frameworks (MOFs) using microcrystal electron diffraction (MicroED) coupled with focused ion beam milling at cryogenic temperatures (cryo-FIB). A microcrystal of the beam-sensitive MOF, ZIF-8, was ion-beam milled in a thin lamella approximately 150 nm thick. MicroED data were collected from this thin lamella using an energy filter and a direct electron detector operating in counting mode. Using this approach, we achieved a greatly improved resolution of 0.59 Å with a minimal total exposure of only 0.64 e−/A2. These innovations not only improve model statistics but also further demonstrate that ion-beam milling is compatible with beam-sensitive materials, augmenting the capabilities of electron diffraction in MOF research.
Original language | English (US) |
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Article number | 113905 |
Journal | Ultramicroscopy |
Volume | 257 |
DOIs | |
State | Published - Mar 2024 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation
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CCDC 2284295: Experimental Crystal Structure Determination
Bardin, A. A. (Contributor), Haymaker, A. (Contributor), Banihashemi, F. (Contributor), Lin, J. Y. S. (Contributor), Martynowycz, M. W. (Contributor) & Nannenga, B. L. (Contributor), Cambridge Crystallographic Data Centre, 2023
DOI: 10.5517/ccdc.csd.cc2gnzy2, http://www.ccdc.cam.ac.uk/services/structure_request?id=doi:10.5517/ccdc.csd.cc2gnzy2&sid=DataCite
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