Fluctuation microscopy with electrons or X-rays: Insight into medium-range order

J. M. Gibson, Michael Treacy, L. Fan, I. McNulty, D. Paterson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)806-807
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Sep 27 2004

ASJC Scopus subject areas

  • Instrumentation

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