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Fixture for In situ Electromigration Testing during X-ray Microtomography
Nikhilesh Chawla (Inventor)
Arizona State University
Research output
:
Patent
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Dive into the research topics of 'Fixture for In situ Electromigration Testing during X-ray Microtomography'. Together they form a unique fingerprint.
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Keyphrases
In Situ
100%
Electromigration
100%
X-ray Microtomography
100%
Elevated Temperature
22%
High Aspect Ratio
22%
Region of Interest
22%
Scanning Parameters
22%
Electromigration Effect
22%
Ceramics Heater
22%
High-resolution
11%
Synchrotron
11%
Electron Microscopy
11%
Microelectronics
11%
Numerical Model
11%
Software Support
11%
Scanning Electron Microscope
11%
Material Behavior
11%
Soldering
11%
Electronic Packaging
11%
Electronic Devices
11%
Material Microstructure
11%
Controlled Experiment
11%
Test Fixture
11%
Reliability Issues
11%
Processing Algorithm
11%
Related Technology
11%
Noise Reduction
11%
Electronic Circuit
11%
Electron Beam Scanning
11%
Solder Joint
11%
Semiconductor Packaging
11%
Algorithmic Modeling
11%
Parameter Optimization
11%
Lab-scale System
11%
Uneven Distribution
11%
Solder Interconnect
11%
High-resolution X-ray Tomography
11%
Image Noise
11%
Scanning Microscope
11%
Sample Manipulation
11%
Reconstructed Data
11%
X-ray Tomography System
11%
Short-circuit Failure
11%
Open-circuit Failure
11%
Material Science
Electronic Circuit
100%
Scanning Electron Microscopy
100%
X-Ray Microtomography
100%
Anode
50%
Electron Microscopy
50%
Cathode
50%
Tomography
50%