TY - GEN
T1 - Extending 1kb RRAM array from weak PUF to strong PUF by employment of SHA module
AU - Liu, Rui
AU - Wu, Huaqiang
AU - Pang, Yachun
AU - Qian, He
AU - Yu, Shimeng
N1 - Funding Information:
This work is in part supported by NSF-CNS-1615774 and SRC Contract 2016-TS-2691.
Publisher Copyright:
© 2017 IEEE.
PY - 2018/5/3
Y1 - 2018/5/3
N2 - Recently, the resistance variability of Resistive Random Access Memory (RRAM) based array has been exploited to design a weak Physical Unclonable Function (PUF) for the cryptographic key generation. Generally, memory-based PUF is weak PUF as the challenge-response pair (CRP) space is limited by the memory capacity. In this work, we propose a design of RRAM based strong PUF for device authentication by employing Secure Hash Algorithm (SHA). The key idea is to split the challenge bits into two segments. The first segment is fed into the RRAM array and the output of the RRAM array is mixed with the second segment as the input to the SHA module, thereby significantly increasing the CRP space. To analyze the properties of the proposed strong PUF such as uniqueness and reliability, the resistance variability is experimentally measured from the fabricated 1 kb HfO2 based RRAM arrays, and the read current distribution is then modeled. The simulation shows that when the number of bits from RRAM is larger than 8 bits, the proposed PUF can present good uniqueness. In order to achieve higher security against PUF modeling attack, however, more bits from RRAM array should be feed into SHA module. With 32-bit from RRAM array, it could achieve average uniqueness ∼49.95%, uniformity of '1's ∼49.81%, diffusiveness ∼49.97% with tight distributions. The use of SHA imposes a strict requirement on the reliability, thus multiple RRAM cells are grouped and used to statistically minimize the risk of early retention failure of a single cell. On the other hand, the use of SHA provides a strong resistance against the machine learning attack as demonstrated through 3-layer multi-layer perceptron (MLP) modeling.
AB - Recently, the resistance variability of Resistive Random Access Memory (RRAM) based array has been exploited to design a weak Physical Unclonable Function (PUF) for the cryptographic key generation. Generally, memory-based PUF is weak PUF as the challenge-response pair (CRP) space is limited by the memory capacity. In this work, we propose a design of RRAM based strong PUF for device authentication by employing Secure Hash Algorithm (SHA). The key idea is to split the challenge bits into two segments. The first segment is fed into the RRAM array and the output of the RRAM array is mixed with the second segment as the input to the SHA module, thereby significantly increasing the CRP space. To analyze the properties of the proposed strong PUF such as uniqueness and reliability, the resistance variability is experimentally measured from the fabricated 1 kb HfO2 based RRAM arrays, and the read current distribution is then modeled. The simulation shows that when the number of bits from RRAM is larger than 8 bits, the proposed PUF can present good uniqueness. In order to achieve higher security against PUF modeling attack, however, more bits from RRAM array should be feed into SHA module. With 32-bit from RRAM array, it could achieve average uniqueness ∼49.95%, uniformity of '1's ∼49.81%, diffusiveness ∼49.97% with tight distributions. The use of SHA imposes a strict requirement on the reliability, thus multiple RRAM cells are grouped and used to statistically minimize the risk of early retention failure of a single cell. On the other hand, the use of SHA provides a strong resistance against the machine learning attack as demonstrated through 3-layer multi-layer perceptron (MLP) modeling.
KW - RRAM
KW - SHA-256
KW - hardware security
KW - machine learning attack
KW - reliability
KW - strong PUF
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U2 - 10.1109/AsianHOST.2017.8353997
DO - 10.1109/AsianHOST.2017.8353997
M3 - Conference contribution
AN - SCOPUS:85050951263
T3 - Proceedings of the 2017 Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2017
SP - 67
EP - 72
BT - Proceedings of the 2017 Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2017
Y2 - 19 October 2017 through 20 October 2017
ER -