Experimental methods and data analysis for fluctuation microscopy

P. M. Voyles, Michael Treacy, J. M. Gibson, H. C. Jin, J. R. Abelson

Research output: Chapter in Book/Report/Conference proceedingChapter

11 Scopus citations


We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
Number of pages6
StatePublished - 2000
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials


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