Experimental low-voltage point-projection microscopy and its possibilities

John Spence, W. Qian, A. J. Melmed

Research output: Contribution to journalArticlepeer-review

39 Scopus citations


The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.

Original languageEnglish (US)
Pages (from-to)473-477
Number of pages5
Issue number3-4
StatePublished - Dec 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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