Experimental evidence for dislocation core structures in silicon

John Spence, Christoph Koch

Research output: Contribution to journalArticlepeer-review

8 Scopus citations


An electron diffraction technique to obtain experimental evidence for dislocation core structures in silicon was discussed. The study of dislocation cores is constrained by geometry to be automatically straight, and instructive, as they play an important role in the embrittlement of intermetallic alloys. Multiple scattering simulations suggested the atomic arrangement along the core of a dislocation measured by HOLZ electron microdiffraction if the core is straight with kinked segments. Related experiments were suggested by the same method on the temperature dependence and activation energy of atomic processes at dislocation cores.

Original languageEnglish (US)
Pages (from-to)1273-1278
Number of pages6
JournalScripta Materialia
Issue number11
StatePublished - Nov 3 2001


  • Dislocation core structure
  • Electron diffraction
  • Reconstruction
  • STEM

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys


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