Fingerprint
Dive into the research topics of 'Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications
Fahad Al Mamun, Sarma Vrudhula, Dragica Vasileska, Hugh Barnaby, Ivan Sanchez Esqueda
- Computer Science and Engineering
- Embedded Systems, Consortium for (CES)
- Intelligent, Distributed, Embedded Applications and Systems, Center for (IDEAS)
- Sustainability Initiative
- Computational Nanoscience, Center for (CCN)
- Solid State Electronics Research Center (CSSER)
- Nano-Electronics, Arizona Institute of (AINE)
- Photonics Innovation, Center for (CPhI)
- Electrical Engineering
- QESST ERC Consortium
- Global Futures Laboratory, Julie Ann Wrigley (GFL)
- Core Facilities (CF)
- Connection One (C1)
- Applied Nanoionics, Center for (CANi)
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations