Abstract
An accurate numerical model is established for the simulation of buried contact cells in two dimensions. The physical parameters and the approximations are discussed as well as the procedures that lead to the foundations of the model. The model is applied to bifacial cells with three different rear surface configurations: passivated by a thermally grown oxide (A), by a dopand-induced floating junction (B) and with a contacted junction (C). Especially when the cell is situated in a light-concentrating roof tile, configuration C performs far better than A and B. The two-dimensional effects of resistive losses in the semiconductor region of the cell are also discussed.
Original language | English (US) |
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Title of host publication | Conference Record of the IEEE Photovoltaic Specialists Conference |
Editors | Anon |
Publisher | IEEE |
Pages | 179-182 |
Number of pages | 4 |
State | Published - 1997 |
Externally published | Yes |
Event | Proceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference - Anaheim, CA, USA Duration: Sep 29 1997 → Oct 3 1997 |
Other
Other | Proceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference |
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City | Anaheim, CA, USA |
Period | 9/29/97 → 10/3/97 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Condensed Matter Physics