ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.

N. J. Shah, H. Ahmed, L. A. Freeman, David J. Smith

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Institute of Physics Conference Series
Publisher	Inst of Physics
Pages	125-130
Number of pages	6
Edition	67
ISBN (Print)	0854981586
State	Published - Dec 1 1983
Externally published	Yes

Name	Institute of Physics Conference Series
Number	67
ISSN (Print)	0373-0751

ASJC Scopus subject areas

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title = "ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.",

author = "Shah, {N. J.} and H. Ahmed and Freeman, {L. A.} and Smith, {David J.}",

year = "1983",

month = dec,

day = "1",

language = "English (US)",

isbn = "0854981586",

series = "Institute of Physics Conference Series",

publisher = "Inst of Physics",

number = "67",

pages = "125--130",

booktitle = "Institute of Physics Conference Series",

edition = "67",

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T1 - ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.

AU - Shah, N. J.

AU - Ahmed, H.

AU - Freeman, L. A.

AU - Smith, David J.

PY - 1983/12/1

Y1 - 1983/12/1

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M3 - Conference contribution

AN - SCOPUS:0020928464

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T3 - Institute of Physics Conference Series

SP - 125

EP - 130

BT - Institute of Physics Conference Series

PB - Inst of Physics

ER -