Abstract
This report suggests that an electron energy-loss spectroscopy technique under low beam intensity is useful for beam-sensitive materials. High quality 'damage-free' Ge M45 edge near-edge structure can be obtained using this method in rutile-GeO2, which is susceptible to high-energy electron beam damage. Both experimental and theoretical results indicate that the Ge M45 edge ELNES can be used to distinguish fourfold and sixfold coordinated Ge.
Original language | English (US) |
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Pages (from-to) | 2813-2816 |
Number of pages | 4 |
Journal | Journal of Non-Crystalline Solids |
Volume | 353 |
Issue number | 29 |
DOIs | |
State | Published - Sep 15 2007 |
Keywords
- STEM/TEM
- Short-range order
- TEM/STEM
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry