ELDRS: Optimization tools for the switched dose rate technique

J. Boch, Y. Gonzalez Velo, F. Saigné, N. J.H. Roche, S. Perez, R. D. Schrimpf, J. R. Vaille, L. Dusseau, J. Mekki, E. Lorfevre, R. Ecoffet

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

Original languageEnglish (US)
Article number6075297
Pages (from-to)2998-3003
Number of pages6
JournalIEEE Transactions on Nuclear Science
Issue number6 PART 1
StatePublished - Dec 2011
Externally publishedYes


  • Accelerated test method
  • dose rate
  • switching experiments
  • total dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering


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