Abstract
CBRAM cells were irradiated with 14 MeV neutrons to a total fluence of 3.19×1013 n/cm2. This is the first time that the effect of displacement damage on the DC characteristics of CBRAM has been examined. The high resistance and low resistance states of the cells are shown to converge with increasing neutron fluence. After reaching a fluence of 2.93×1013 n/cm2, the CBRAM cells became irrecoverably locked into their final resistance state.
Original language | English (US) |
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Title of host publication | 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1-4 |
Number of pages | 4 |
Volume | 2016-September |
ISBN (Electronic) | 9781509043668 |
DOIs | |
State | Published - Oct 31 2017 |
Event | 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 - Bremen, Germany Duration: Sep 19 2016 → Sep 23 2016 |
Other
Other | 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 |
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Country/Territory | Germany |
City | Bremen |
Period | 9/19/16 → 9/23/16 |
Keywords
- cation
- CBRAM
- chalcogenide glass
- conductive bridging
- displacement damage
- ECM
- electrochemical metallization
- memristors
- nanoionic memory
- neutrons
- PMC
- programmable metallization cell
- radiation effects
- ReRAM
- resistive switching
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Radiation