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Effect of the source field plate on AlGaN/GaN high electron mobility transistors during off-state stress
L. Liu, T. S. Kang, D. A. Cullen, L. Zhou, J. Kim, C. Y. Chang, E. A. Douglas, S. Jang, David Smith, S. J. Pearton, W. J. Johnson, F. Ren
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Scopus
citations