Abstract
Variations of the characteristics of Sb-surfactant assisted grown InGaAsN/GaAs single quantum wells (QWs) in dependence on QW growth temperature (TGR = 442-505 °C) are investigated by the photoluminescence (PL) and high-resolution X-ray diffraction (HRXRD) methods. The QWs grown at ∼480 °C demonstrated optimal PL characteristics, namely the highest PL intensity and small potential fluctuations. A good quality of heterointerfaces is proved by HRXRD. These structures emit at ∼1.29 μm at 300 K and are promising for application in long wavelength opto-electronic devices. The good structural properties of these QWs are assigned to Sb surfactant effect that allows shifting of the TGR to higher temperatures without significant alloy decomposition. The increase of TGR in its turn results in the decrease of the density of nonradiative defects that are the specific feature of low temperature growth.
Original language | English (US) |
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Pages (from-to) | 786-789 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 515 |
Issue number | 2 SPEC. ISS. |
DOIs | |
State | Published - Oct 25 2006 |
Keywords
- HRXRD
- III-V semiconductors
- PL
- Quantum well
- Surfactant-assisted growth
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry