Diffraction microscopy for disordered tetrahedral networks

Ju Yin Cheng; Michael Treacy; P. J. Keblinski; J. M. Gibson

doi:10.1063/1.1711174

Diffraction microscopy for disordered tetrahedral networks

Ju Yin Cheng, Michael Treacy, P. J. Keblinski, J. M. Gibson

Physics

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Abstract

The amorphous structures of silica, silicon, and germanium were studied. Using transmission electron microscopy, the diffraction intensity and associated fluctuations in both reciprocal and real spaces were obtained. An orientational variance in diffuse reflections was also computed in order to observe the medium range order of the structures. Using fluctuation microscopy, it was found that amorphous germanium showed a slightly disordered structure compared to amorphous silicon.

Original language	English (US)
Pages (from-to)	7779-7784
Number of pages	6
Journal	Journal of Applied Physics
Volume	95
Issue number	12
DOIs	https://doi.org/10.1063/1.1711174
State	Published - Jun 15 2004

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.1711174

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title = "Diffraction microscopy for disordered tetrahedral networks",

abstract = "The amorphous structures of silica, silicon, and germanium were studied. Using transmission electron microscopy, the diffraction intensity and associated fluctuations in both reciprocal and real spaces were obtained. An orientational variance in diffuse reflections was also computed in order to observe the medium range order of the structures. Using fluctuation microscopy, it was found that amorphous germanium showed a slightly disordered structure compared to amorphous silicon.",

author = "Cheng, {Ju Yin} and Michael Treacy and Keblinski, {P. J.} and Gibson, {J. M.}",

year = "2004",

month = jun,

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AU - Cheng, Ju Yin

AU - Treacy, Michael

AU - Keblinski, P. J.

AU - Gibson, J. M.

PY - 2004/6/15

Y1 - 2004/6/15

N2 - The amorphous structures of silica, silicon, and germanium were studied. Using transmission electron microscopy, the diffraction intensity and associated fluctuations in both reciprocal and real spaces were obtained. An orientational variance in diffuse reflections was also computed in order to observe the medium range order of the structures. Using fluctuation microscopy, it was found that amorphous germanium showed a slightly disordered structure compared to amorphous silicon.

AB - The amorphous structures of silica, silicon, and germanium were studied. Using transmission electron microscopy, the diffraction intensity and associated fluctuations in both reciprocal and real spaces were obtained. An orientational variance in diffuse reflections was also computed in order to observe the medium range order of the structures. Using fluctuation microscopy, it was found that amorphous germanium showed a slightly disordered structure compared to amorphous silicon.

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DO - 10.1063/1.1711174

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

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ER -

Diffraction microscopy for disordered tetrahedral networks

Abstract

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