Abstract
To improve the efficiency of Si-based solar cells beyond their Shockley-Queisser limit, the optimal path is to integrate them with III-V-based solar cells. In this work, we present high performance GaP/Si heterojunction solar cells with a high Si minority-carrier lifetime and high crystal quality of epitaxial GaP layers. It is shown that by applying phosphorus (P)-diffusion layers into the Si substrate and a SiN x layer, the Si minority-carrier lifetime can be well-maintained during the GaP growth in the molecular beam epitaxy (MBE). By controlling the growth conditions, the high crystal quality of GaP was grown on the P-rich Si surface. The film quality is characterized by atomic force microscopy and high-resolution x-ray diffraction. In addition, MoO x was implemented as a hole-selective contact that led to a significant increase in the short-circuit current density. The achieved high device performance of the GaP/Si heterojunction solar cells establishes a path for further enhancement of the performance of Si-based photovoltaic devices.
Original language | English (US) |
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Article number | e58292 |
Journal | Journal of Visualized Experiments |
Volume | 2018 |
Issue number | 141 |
DOIs | |
State | Published - Nov 2018 |
Keywords
- Engineering
- Gap
- Heterojunction solar cells
- Issue 141
- MBE
- Minority-carrier lifetime
- MoO
- Photovoltaics
- Si
ASJC Scopus subject areas
- Neuroscience(all)
- Chemical Engineering(all)
- Biochemistry, Genetics and Molecular Biology(all)
- Immunology and Microbiology(all)