Determination of the local Al concentration in AlxGa 1-xAs-GaAs quantum well structures using the (200) diffraction intensity obtained with a 10 Å electron beam

H. J. Ou, S. C Y Tsen, Kong-Thon Tsen, J. M. Cowley, J. I. Chyi, A. Salvador, H. Morkoç

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Physics & Astronomy