@inproceedings{1372d2e997854c9abcf2de904926649e,
title = "Determination of Series Resistance in CdSeTe/CdTe Solar Cells by the Jsc-Voc Method",
abstract = "While commonly used in Si solar cell characterization, the Suns- Vocmethod of determining series resistance (Rs) is rarely used for CdTe and its alloys. However, it is advantageous relative to the slope method-commonly used in the CdTe community-because it measures series resistance at the maximum power point, at which a solar cell operates. Using the self-consistent predecessor to \mathrm{Suns}-\mathrm{V}_{\mathrm{oc}}, \mathrm{J}_{\mathrm{sc}}-\mathrm{V}_{\mathrm{oc}}, we determine \mathrm{R}_{\mathrm{s}} of two different \mathrm{CdSeTe}/\mathrm{CdTe} solar cell structures to be 0.96 and 2.72 µcm2, with repeated measurements showing little deviation.",
keywords = "Cadmium Telluride, Characterization, Fill Factor, Series Resistance",
author = "Carey Reich and Arthur Onno and Alexandra Bothwell and Anna Kindvall and Zachary Holman and Walajabad Sampath",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 ; Conference date: 15-06-2020 Through 21-08-2020",
year = "2020",
month = jun,
day = "14",
doi = "10.1109/PVSC45281.2020.9300880",
language = "English (US)",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1898--1899",
booktitle = "2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020",
}