Detection of the diatomic dications SiH ²⁺ and AlH ²⁺

Engineering & Materials Science

• Ions 100%
• Toluene 87%
• Secondary ion mass spectrometry 54%
• Amorphous silicon 49%
• Sputtering 46%
• Molecules 35%
• Vapors 32%
• Oxygen 29%
• Substrates 25%
• Gases 20%

Physics & Astronomy

• toluene 78%
• ions 50%
• mass spectra 37%
• secondary ion mass spectrometry 37%
• amorphous silicon 33%
• micrometers 32%
• energy distribution 31%
• vapor phases 28%
• sputtering 28%
• vapors 27%
• oxygen 21%
• decay 20%
• molecules 19%

Chemical Compounds

• Surface 69%
• Ionization 57%
• Amorphous Silicon 49%
• Sputtering 39%
• Mass Spectrum 31%
• Toluene 26%
• Gas 19%
• Dioxygen 17%
• Energy 17%
• Ion 14%
• Molecule 12%