Abstract
A correction procedure for the delocalization effect when determining the site occupancy of an impurity element by atom location by channelling-enhanced microanalysis is proposed. The procedure utilizes a disordered structure with a composition similar to the ordered structure. Correction factors are derived by illuminating a sample with a disordered structure in the same orientation as for the ordered structure. The correction procedure is applied to a determination of the Ti occupancy in a Ni3Al intermetallic compound.
Original language | English (US) |
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Pages (from-to) | 425-432 |
Number of pages | 8 |
Journal | Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties |
Volume | 67 |
Issue number | 2 |
DOIs | |
State | Published - Feb 1993 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Materials Science
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)
- Metals and Alloys