## Abstract

A cycle time-throughput curve quantifies the relationship of average cycle time to throughput rates in a manufacturing system. Moreover, it indicates the asymptotic capacity of a system. Such a curve is used to characterize system performance over a range of start rates. Simulation is a fundamental method for generating such curves since simulation can handle the complexity of real systems with acceptable precision and accuracy. A simulation-based cycle time-throughput curve requires a large amount of simulation output data; the precision and accuracy of a simulated curve may be poor if there is insufficient simulation data. To overcome these problems, sequential simulation experiments based on a nonlinear D-optimal design are suggested. Using the nonlinear shape of the curve, such a design pinpoints p starting design points, and then sequentially ranks the remaining n - p candidate design points, where n is the total number of possible design points being considered. A model of a semiconductor wafer fabrication facility is used to validate the approach. The sequences of experimental runs generated can be used as references for simulation experimenters.

Original language | English (US) |
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Pages (from-to) | 981-990+1078 |

Journal | Operations Research |

Volume | 50 |

Issue number | 6 |

DOIs | |

State | Published - 2002 |

## ASJC Scopus subject areas

- Computer Science Applications
- Management Science and Operations Research