Abstract
The critical concentration of hot carriers necessary to maintain a Maxwellian for the isotropic part of the distribution function is calculated in an asymptotic approximation. The results are applied to electrons in an inversion layer at the surface of silicon.
Original language | English (US) |
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Pages (from-to) | 243-244 |
Number of pages | 2 |
Journal | Physics Letters A |
Volume | 60 |
Issue number | 3 |
DOIs | |
State | Published - Feb 21 1977 |
ASJC Scopus subject areas
- Physics and Astronomy(all)