Challenges and opportunities in materials science with next generation monochromated EELS

Peter Crozier, J. Zhu, T. Aoki, Peter Rez, W. J. Bowman, Ray Carpenter, O. L. Krivanek, N. Dellby, T. C. Lovejoy, R. F. Egerton

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations
Original languageEnglish (US)
Pages (from-to)72-73
Number of pages2
JournalMicroscopy and Microanalysis
Issue number3
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

ASJC Scopus subject areas

  • Instrumentation

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