TY - GEN
T1 - Cell Metallic Contact Resistance of Field-Retrieved PV Modules
AU - Li, Fang
AU - Gopakumar, Abhijit
AU - Pavan Buddha, Viswa Sai
AU - Schneller, Eric J.
AU - Iqbal, Nafis
AU - Davis, Kristopher O.
AU - Tamizhmani, Govinda Samy
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/6/14
Y1 - 2020/6/14
N2 - It is well known that the series resistance of photovoltaic (PV) modules increases over time in the field. Depending on the stress level and duration of local field/climatic conditions (e.g., temperature, humidity), the extent of series resistance increase can vary. To reduce the overall increase of the series resistance, it is crucial to determine and understand the extent of resistance increase in the individual components (i.e., cell metallization and interconnect solder bonds) of the field exposed modules. The cell metallization resistance is caused by both line resistance of the gridlines and the contact resistance between gridlines and semiconductor. This paper analyzes the increase of gridline resistance and contact resistance of the cells in the PV modules of same construction/type retrieved from two different high stress level climatic conditions, hot-dry (Arizona) and hot-humid (Florida). To correlate the contact resistance data with other studies, both retrieved-modules and extracted-cells have been characterized by current-voltage, UV fluorescence, reflected light microscopy and X-ray photoelectron spectroscopy measurements.
AB - It is well known that the series resistance of photovoltaic (PV) modules increases over time in the field. Depending on the stress level and duration of local field/climatic conditions (e.g., temperature, humidity), the extent of series resistance increase can vary. To reduce the overall increase of the series resistance, it is crucial to determine and understand the extent of resistance increase in the individual components (i.e., cell metallization and interconnect solder bonds) of the field exposed modules. The cell metallization resistance is caused by both line resistance of the gridlines and the contact resistance between gridlines and semiconductor. This paper analyzes the increase of gridline resistance and contact resistance of the cells in the PV modules of same construction/type retrieved from two different high stress level climatic conditions, hot-dry (Arizona) and hot-humid (Florida). To correlate the contact resistance data with other studies, both retrieved-modules and extracted-cells have been characterized by current-voltage, UV fluorescence, reflected light microscopy and X-ray photoelectron spectroscopy measurements.
KW - contact resistance
KW - encapsulant browning
KW - moisture
KW - series resistance
UR - http://www.scopus.com/inward/record.url?scp=85099583239&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85099583239&partnerID=8YFLogxK
U2 - 10.1109/PVSC45281.2020.9300599
DO - 10.1109/PVSC45281.2020.9300599
M3 - Conference contribution
AN - SCOPUS:85099583239
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1721
EP - 1726
BT - 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Y2 - 15 June 2020 through 21 August 2020
ER -