Benchmarking Heterogeneous Integration with 2.5D/3D Interconnect Modeling

Zhenyu Wang, Jingbo Sun, Alper Goksoy, Sumit K. Mandal, Jae Sun Seo, Chaitali Chakrabarti, Umit Ogras, Vidya Chhabria, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Current monolithic designs face significant challenges in terms of silicon area, fabrication cost, and data movement especially when dealing with increasingly complex and diverse AI models. With advanced packaging, 2.5D and 3D interconnection today provide high bandwidth and high channel density that are comparable to on-chip interconnect, inspiring new architectures and design paradigms for future AI hardware. In this work, we propose HISIM, a benchmarking tool for chiplet-based heterogeneous integration (HI), that evaluates the performance of monolithic, 2.5D, and 3D systems. HISIM emphasizes the hierarchical interconnection and associated data movement in the HI system. It integrates the technology roadmap of 2.5D/3D wires, conducts electrical modeling and analysis, and performs cycle-accurate simulations of data movement. Combined with the performance model of various types of computing elements, HISIM provides a flexible and efficient platform for HI system mapping. We demonstrate the applicability of HISIM on DNNs, transformers, and graph neural networks, to illustrate tradeoffs in placement/routing methods and power distribution. Besides, we propose the co-design of AI placement and frequency tuning under thermal constraints. Our results highlight the advantages of 3D interconnect in HI system performance and the emerging limitation of power dissipation.

Original languageEnglish (US)
Title of host publicationProceedings of 2023 IEEE 15th International Conference on ASIC, ASICON 2023
EditorsFan Ye, Ting-Ao Tang
PublisherIEEE Computer Society
ISBN (Electronic)9798350312980
DOIs
StatePublished - 2023
Event15th IEEE International Conference on ASIC, ASICON 2023 - Nanjing, China
Duration: Oct 24 2023Oct 27 2023

Publication series

NameProceedings of International Conference on ASIC
ISSN (Print)2162-7541
ISSN (Electronic)2162-755X

Conference

Conference15th IEEE International Conference on ASIC, ASICON 2023
Country/TerritoryChina
CityNanjing
Period10/24/2310/27/23

Keywords

  • 2.5D
  • 3D
  • Chiplet
  • Electro-thermal Co-design
  • Heterogeneous Integration
  • ML accelerators

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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