Atomic Resolution Mapping of Localized Phonon Modes in Silicon Grain Boundaries

Benedikt Haas; Tara M. Boland; Christian Elsässer; Arunima K. Singh; Katia March; Juri Barthel; Christoph T. Koch; Peter Rez

doi:10.1093/micmic/ozad067.300

Atomic Resolution Mapping of Localized Phonon Modes in Silicon Grain Boundaries

Benedikt Haas, Tara M. Boland, Christian Elsässer, Arunima K. Singh, Katia March, Juri Barthel, Christoph T. Koch, Peter Rez

Physics

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	618-619
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.300
State	Published - Jul 22 2023

ASJC Scopus subject areas

Instrumentation

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10.1093/micmic/ozad067.300

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title = "Atomic Resolution Mapping of Localized Phonon Modes in Silicon Grain Boundaries",

author = "Benedikt Haas and Boland, {Tara M.} and Christian Els{\"a}sser and Singh, {Arunima K.} and Katia March and Juri Barthel and Koch, {Christoph T.} and Peter Rez",

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AU - Haas, Benedikt

AU - Boland, Tara M.

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AU - March, Katia

AU - Barthel, Juri

AU - Koch, Christoph T.

AU - Rez, Peter

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AN - SCOPUS:85168586590

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JO - Microscopy and Microanalysis

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IS - 1

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Atomic Resolution Mapping of Localized Phonon Modes in Silicon Grain Boundaries

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