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An investigation of fT and fmax degradation due to device interconnects in 0.5 THz SiGe HBT technology
A. Cagri Ulusoy, Robert L. Schmid, Saeed Zeinolabedinzadeh, Wasif T. Khan, Mehmet Kaynak, Bernd Tillack, John D. Cressler
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
7
Scopus
citations