Abstract
A low temperature, 180°C, amorphous Si (a-Si:H) process on bonded stainless steel substrates is discussed and a 3.8-inch QVGA active matrix (AM) electrophoretic display as well as a 64×64 electrophoretic display with integrated column drivers are demonstrated. The n-channel thin-film transistors (TFTs) exhibited saturation mobilities of 0.7 cm 2/V-sec, median drive currents of 26.2 μA and low defectivity.
Original language | English (US) |
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Title of host publication | Digest of Technical Papers - SID International Symposium |
Pages | 422-424 |
Number of pages | 3 |
Volume | 39 |
Edition | 1 |
State | Published - 2008 |
Event | 2008 SID International Symposium - Los Angeles, CA, United States Duration: May 20 2008 → May 21 2008 |
Other
Other | 2008 SID International Symposium |
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Country/Territory | United States |
City | Los Angeles, CA |
Period | 5/20/08 → 5/21/08 |
ASJC Scopus subject areas
- General Engineering