@inproceedings{656a429ab3ab4424901a0c8a09002d52,
title = "ACE: A robust variability and aging sensor for high-k/metal gate SoC",
abstract = "A novel on-chip variability and aging sensor has been designed for robust generation of a voltage guard band in high-K/metal gate technologies. It is the first single sensor solution that is capable of guard-banding for both NBTI and PBTI effects. It offers the SoC the capability to dynamically adjust the on-chip guard-band for joint power-reliability optimization.",
author = "Min Chen and Vijay Reddy and Srikanth Krishnan and Jay Ondrusek and Yu Cao",
year = "2013",
month = jan,
day = "1",
doi = "10.1109/ESSDERC.2013.6818849",
language = "English (US)",
isbn = "9781479906499",
series = "European Solid-State Device Research Conference",
publisher = "IEEE Computer Society",
pages = "182--185",
booktitle = "ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference",
note = "43rd European Solid-State Device Research Conference, ESSDERC 2013 ; Conference date: 16-09-2013 Through 20-09-2013",
}