@inproceedings{9d71244148dc4c28b28cbc0cb00d7a3b,
title = "A W-Band SiGe Transceiver with Built-in Self-Test",
abstract = "A fully integrated W-band silicon-germanium (SiGe) transceiver is presented which provides a loop-back built-in self-test (BIST) functionality that allows continuous monitoring of the health of the system while in use. In addition, it facilitates on-die measurement of the transmit and receive channels to aid in characterization of the transceivers inside a large phased array system. Measurement results show a close agreement between the on-die and off-chip characterization results. The transceiver can switch from normal operation mode to BIST mode by applying a control signal. Measurement shows receiver SSB noise figure of 12 dB and P1dB of -8.5 dBm and transmitter output power of +8 dBm. The power consumption of the entire transceiver is 150 mW.",
keywords = "BIST, built-in self-test, front-end, millimeter-wave, phased array, SiGe, W-band",
author = "S. Zeinolabedinzadeh and Ulusoy, {A. C.} and Schmid, {R. L.} and F. Inanlou and I. Song and T. Chi and Park, {J. S.} and H. Wang and Cressler, {J. D.}",
year = "2019",
month = may,
day = "7",
doi = "10.1109/SIRF.2019.8709094",
language = "English (US)",
series = "2019 IEEE 19th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2019 IEEE 19th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2019",
note = "19th IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2019 ; Conference date: 20-01-2019 Through 23-01-2019",
}