A simple electronic aperture for rastered-beam depth profiles

Peter Williams, Charles A. Evans

Research output: Contribution to journalArticlepeer-review

9 Scopus citations


A simple, inexpensive electronic aperture for use in depth profiling with ion microprobes and ion-scattering spectrometers is described. The system derives a gate signal from a photocell which views the center of an oscilloscope display driven by the ion beam raster voltages.

Original languageEnglish (US)
Pages (from-to)327-331
Number of pages5
JournalInternational Journal of Mass Spectrometry and Ion Physics
Issue number3-4
StatePublished - Dec 1976
Externally publishedYes


Dive into the research topics of 'A simple electronic aperture for rastered-beam depth profiles'. Together they form a unique fingerprint.

Cite this