Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics