A novel design of scanning tunneling microscopy and atomic force microscopy in one microscope

Tainwei Jing, Stuart Lindsay, Daphna R. Yaniv

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)155-157
Number of pages3
Issue number3
StatePublished - 1996

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this