A high‐resolution electron microscopic study of defects in sodium β′″‐alumina

R. Hull, David J. Smith, C. J. Humphreys

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


A high‐resolution electron‐microscopic study of sodium β′″‐alumina, a polytype of the more‐widely‐studied sodium β‐ and β″‐alumina, has been undertaken using the 600 kV instrument at Cambridge University. Images revealed the loss of sodium‐containing planes, which had caused crystals to collapse and shear into defect layers. A model for the structure of these defects is proposed, based on the use of computed images and by comparison with high‐resolution images of silver β″‐alumina. 1983 Blackwell Science Ltd

Original languageEnglish (US)
Pages (from-to)203-214
Number of pages12
JournalJournal of Microscopy
Issue number2
StatePublished - May 1983
Externally publishedYes


  • High resolution electron microscopy
  • conduction planes
  • image simulations
  • sodium β‐alumina
  • structure imaging
  • superionic conductors

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology


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