A high resolution mass spectrometer for atomic mass determinations

R. C. Barber, R. L. Bishop, H. E. Duckworth, J. O. Meredith, F. C.G. Southon, P. Van Rookhuyzen, P. Williams

Research output: Contribution to journalArticlepeer-review

37 Scopus citations


A high resolution, second-order double-focusing mass spectrometer has been constructed for the precise determination of atomic mass differences. The instrument has a mean radius of curvature in the electrostatic analyzer of 1 m and has operated with a resolving power at the base of the peaks of ∼200 000. Details of current operation are given. The best precision achieved to date is 2.5×10-9, corresponding to ∼250 eV at M = 100 amu; typical precision is ∼5×10-9.

Original languageEnglish (US)
Pages (from-to)1-8
Number of pages8
JournalReview of Scientific Instruments
Issue number1
StatePublished - 1971
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation


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