TY - GEN
T1 - A Decentralized MILP Method for Rescheduling Semiconductor Assembly Systems with Re-Entrance and Time Window Constraints
AU - Su, Yutong
AU - Ju, Feng
AU - Ananthanarayanan, Balakrishnan
AU - Dauod, Husam
AU - Patel, Nital S.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - In semiconductor manufacturing, a master schedule over several weeks' time horizon is typically created to optimize production. However, during the production run, the semiconductor assembly line is subject to random disruptions, such as machine failures, which may cause the master schedule to become sub-optimal due to delays or even infeasible by violating key time window constraints. In this paper, to handle such disruptions, a decentralized mixed integer programming approach is proposed to reschedule the system considering the re-entrant flows and time window constraints, in order to keep up with the original master schedule. The original master schedule is taken as a warm start, and the new adjusted schedule is obtained by the CPLEX Optimizer. In this way, the semiconductor assembly line can properly react to a machine failure without replacing the whole master schedule. The method ensures the products meet the time window constraints and the delay against the master schedule is minimized. The experimental results show that the proposed method can dramatically reduce the delay and time window violations caused by disruptions.
AB - In semiconductor manufacturing, a master schedule over several weeks' time horizon is typically created to optimize production. However, during the production run, the semiconductor assembly line is subject to random disruptions, such as machine failures, which may cause the master schedule to become sub-optimal due to delays or even infeasible by violating key time window constraints. In this paper, to handle such disruptions, a decentralized mixed integer programming approach is proposed to reschedule the system considering the re-entrant flows and time window constraints, in order to keep up with the original master schedule. The original master schedule is taken as a warm start, and the new adjusted schedule is obtained by the CPLEX Optimizer. In this way, the semiconductor assembly line can properly react to a machine failure without replacing the whole master schedule. The method ensures the products meet the time window constraints and the delay against the master schedule is minimized. The experimental results show that the proposed method can dramatically reduce the delay and time window violations caused by disruptions.
UR - http://www.scopus.com/inward/record.url?scp=85174399123&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85174399123&partnerID=8YFLogxK
U2 - 10.1109/CASE56687.2023.10260333
DO - 10.1109/CASE56687.2023.10260333
M3 - Conference contribution
AN - SCOPUS:85174399123
T3 - IEEE International Conference on Automation Science and Engineering
BT - 2023 IEEE 19th International Conference on Automation Science and Engineering, CASE 2023
PB - IEEE Computer Society
T2 - 19th IEEE International Conference on Automation Science and Engineering, CASE 2023
Y2 - 26 August 2023 through 30 August 2023
ER -