TY - GEN
T1 - A comprehensive study of 18-19 years field aged modules for degradation rate determination along with defect detection and analysis using IR, EL, UV
AU - Ali, Saddam
AU - Ali, Asad
AU - Saher, Saim
AU - Agha, Haider Saif
AU - Bin Abdul Majeed, Hatif
AU - Mahmood, Farrukh Ibne
AU - Tamizhmani, Govindasamy
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/3/9
Y1 - 2018/3/9
N2 - Determination of the degradation modes and degradation rates of solar photo-voltaic (PV) modules in field exposure is of paramount importance in PV reliability studies. This contribution aims at the IV, IR, UV, and EL characterization of PV modules for determination of defects and correlation with the performance parameters (FF, Pmax, Isc) along with series resistance. 24 PV modules aged 18-19 years in hot desert conditions of Arizona, USA were subjected to various characterization techniques. First baseline light IV and dark IV was performed and the results were used to calculate the degradation in Pmax, Isc, FF, series resistances (Rs). The Pmax, FF, Isc, and Rs were degraded 1.36%/year, 0.53%/year, 0.88%/year, 3.026%/year respectively. After this IR, UV and EL imaging was performed on the modules. The IR thermography showed major temperature anomalies and hotspots causing overheating and reduced performance. The UV fluorescence imaging revealed encapsulant discoloration of moderate to severe levels that could cause a decline in the intensity of the radiation absorbed by the cells. The EL imaging showed substantial dark areas on all of modules.
AB - Determination of the degradation modes and degradation rates of solar photo-voltaic (PV) modules in field exposure is of paramount importance in PV reliability studies. This contribution aims at the IV, IR, UV, and EL characterization of PV modules for determination of defects and correlation with the performance parameters (FF, Pmax, Isc) along with series resistance. 24 PV modules aged 18-19 years in hot desert conditions of Arizona, USA were subjected to various characterization techniques. First baseline light IV and dark IV was performed and the results were used to calculate the degradation in Pmax, Isc, FF, series resistances (Rs). The Pmax, FF, Isc, and Rs were degraded 1.36%/year, 0.53%/year, 0.88%/year, 3.026%/year respectively. After this IR, UV and EL imaging was performed on the modules. The IR thermography showed major temperature anomalies and hotspots causing overheating and reduced performance. The UV fluorescence imaging revealed encapsulant discoloration of moderate to severe levels that could cause a decline in the intensity of the radiation absorbed by the cells. The EL imaging showed substantial dark areas on all of modules.
KW - El
KW - IR thermography
KW - UV fluorescence
KW - degradation rates
UR - http://www.scopus.com/inward/record.url?scp=85047241761&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85047241761&partnerID=8YFLogxK
U2 - 10.1109/IBCAST.2018.8312180
DO - 10.1109/IBCAST.2018.8312180
M3 - Conference contribution
AN - SCOPUS:85047241761
T3 - Proceedings of 2018 15th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2018
SP - 28
EP - 35
BT - Proceedings of 2018 15th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2018
Y2 - 9 January 2018 through 13 January 2018
ER -