5-GHz Injection-Locked Delay Cell With 10-25 ns Adjustable Group Delay in SiGe BiCMOS

Ata S. Nazhad, Amirreza Alizadeh, Milad Frounchi, John D. Cressler, Bertan Bakkaloglu, Sayfe Kiaei

Research output: Contribution to journalArticlepeer-review

Abstract

This brief presents an on-chip delay line (DL) unit with an adjustable group delay (GD) between 10 and 25 ns. This active DL is designed based on an injection locked voltage-controlled oscillator (ILVCO) topology, with operation frequency of 5 GHz. Analog GD tuning is achieved through the control voltage of the VCO and the power of the injected signal. The free running phase noise (PN) of the DL at 100 kHz and 10 MHz offsets are -98 and -140 dBc/Hz, respectively, and the DL PN follows the PN of the injected signal in the locked mode. The DL was implemented in a 130-nm SiGe BiCMOS platform, and consumes 1.26 mm2 of silicon area. The power dissipation of the VCO core and buffer stage are 1.68 and 17.7 mW, respectively. To the authors best knowledge, the proposed DL achieves one of the highest GDs among the integrated DL cells.

Original languageEnglish (US)
Pages (from-to)1042-1046
Number of pages5
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume71
Issue number3
DOIs
StatePublished - Mar 1 2024

Keywords

  • Delay line
  • SiGe
  • group delay
  • injection locking
  • voltage controlled oscillator

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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