Abstract
A silicon metal-semiconductor-field-effect-transistor (MESFET) power amplifier operating at 900 MHz fabricated on a 45 nm silicon-on-insulator CMOS process with no changes to the process flow is presented. The soft breakdown of the MESFET is 20 times that of the MOSFET and allowed a single transistor amplifier based on Class A bias conditions to operate at up to 32 dBm output power with an 8 V drain bias. The amplifier had a peak power added efficiency of 37.6%, gain of 11.1 dB, OIP3 of 39.3 dBm and 1 dB compression point at an output power of 31.6 dBm. The device required only 0.125 mm2 of active area. Additionally, the depletion mode operation of the MESFET enables a simple input bias approach using an inductor to ground at the gate of the device.
Original language | English (US) |
---|---|
Article number | 6469182 |
Pages (from-to) | 161-163 |
Number of pages | 3 |
Journal | IEEE Microwave and Wireless Components Letters |
Volume | 23 |
Issue number | 3 |
DOIs | |
State | Published - 2013 |
Keywords
- Metal-semiconductor-field-effect- transistor (MESFET)
- power amplifiers (PAs)
- silicon-on-insulator (SOI) technology
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering