Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

L. Wang; Jingyue Liu; J. M. Cowley

Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

L. Wang
, Jingyue Liu
, J. M. Cowley

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

An investigation of oxygen-annealed rutile (110) surface using zero-loss energy filtered reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) is reported in this paper. In REM, the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. In RHEED, 50% to 90% of the electrons contributing to surface reflection spots used for imaging have suffered energy loss of more than 10 eV. All REM images and RHEED patterns were recorded digitally into picture of 1024×1024 pixels.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Publisher	Publ by San Francisco Press Inc
Pages	968-969
Number of pages	2
State	Published - 1993
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

Other

Other	Proceedings of the 51st Annual Meeting Microscopy Society of America
City	Cincinnati, OH, USA
Period	8/1/93 → 8/6/93

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{731457dfee904127a8de07d686199eb3,

title = "Zero-loss energy filtered REM and RHEED observations on rutile (110) surface",

abstract = "An investigation of oxygen-annealed rutile (110) surface using zero-loss energy filtered reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) is reported in this paper. In REM, the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. In RHEED, 50\% to 90\% of the electrons contributing to surface reflection spots used for imaging have suffered energy loss of more than 10 eV. All REM images and RHEED patterns were recorded digitally into picture of 1024×1024 pixels.",

author = "L. Wang and Jingyue Liu and Cowley, \{J. M.\}",

year = "1993",

language = "English (US)",

pages = "968--969",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

publisher = "Publ by San Francisco Press Inc",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - GEN

T1 - Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

AU - Wang, L.

AU - Liu, Jingyue

AU - Cowley, J. M.

PY - 1993

Y1 - 1993

N2 - An investigation of oxygen-annealed rutile (110) surface using zero-loss energy filtered reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) is reported in this paper. In REM, the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. In RHEED, 50% to 90% of the electrons contributing to surface reflection spots used for imaging have suffered energy loss of more than 10 eV. All REM images and RHEED patterns were recorded digitally into picture of 1024×1024 pixels.

AB - An investigation of oxygen-annealed rutile (110) surface using zero-loss energy filtered reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) is reported in this paper. In REM, the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. In RHEED, 50% to 90% of the electrons contributing to surface reflection spots used for imaging have suffered energy loss of more than 10 eV. All REM images and RHEED patterns were recorded digitally into picture of 1024×1024 pixels.

UR - https://www.scopus.com/pages/publications/0027709326

UR - https://www.scopus.com/pages/publications/0027709326#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:0027709326

SP - 968

EP - 969

BT - Proceedings - Annual Meeting, Microscopy Society of America

PB - Publ by San Francisco Press Inc

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -

Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

Abstract

Other

ASJC Scopus subject areas

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