VELOCIMETRY FOR MEMS APPLICATIONS

Steven T. Wereley, Carl D. Meinhart, Juan G. Santiago, Ron J. Adrian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Particle image velocimetry (PIV), a technique commonly used at macroscopic length scales to measure velocity fields of particle-seeded flows, is adapted to measure velocity fields in microfluidic MEMS devices, where micron-scale spatial resolution is critical. Adapting PIV to the microscopic level presents a number of challenges, including visualizing tracer particles that are smaller than the wavelength of light and minimizing errors due to the Brownian motion of the tracer particles. High numerical aperture video microscopy is used to record the faint signals from fluorescent 300 nm particles. Innovative ensemble averaging and adaptive spatial shifting algorithms are used to extract maximal information from the recorded images. The PIV technique is used to measure a low Reynolds number Hele-Shaw flow around an 8 μm human red blood cell. The velocity vector field presented has a maximal spatial resolution of 3.2 × 3.2 × 1.5 μm.

Original languageEnglish (US)
Title of host publicationMicro-Electro-Mechanical Systems (MEMS)
PublisherAmerican Society of Mechanical Engineers (ASME)
Pages453-459
Number of pages7
ISBN (Electronic)9780791815960
DOIs
StatePublished - 1998
Externally publishedYes
EventASME 1998 International Mechanical Engineering Congress and Exposition, IMECE 1998 - Anaheim, United States
Duration: Nov 15 1998Nov 20 1998

Publication series

NameASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
Volume1998-AE

Conference

ConferenceASME 1998 International Mechanical Engineering Congress and Exposition, IMECE 1998
Country/TerritoryUnited States
CityAnaheim
Period11/15/9811/20/98

ASJC Scopus subject areas

  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'VELOCIMETRY FOR MEMS APPLICATIONS'. Together they form a unique fingerprint.

Cite this