Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system

Haifeng He; John Spence

doi:10.1017/S1431927606068978

Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system

Haifeng He, John Spence

Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English (US)
Pages (from-to)	584-585
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606068978
State	Published - Aug 2006

ASJC Scopus subject areas

Instrumentation

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title = "Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system",

author = "Haifeng He and John Spence",

year = "2006",

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pages = "584--585",

journal = "Microscopy and Microanalysis",

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system

ASJC Scopus subject areas

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