Understanding the Resistive Switching Mechanism of 2-D RRAM: Monte Carlo Modeling and a Proposed Application for Reliability Research

Yifu Huang, Yuqian Gu, Yao Feng Chang, Ying Chen Chen, Deji Akinwande, Jack C. Lee

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

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Engineering

Material Science