Transmission electron microscopy of native copper inclusions in illite

Jung Ho Ahn, Xu Huifang, P R Buseck

Research output: Contribution to journalArticlepeer-review

19 Scopus citations
Original languageEnglish (US)
Pages (from-to)295-297
Number of pages3
JournalClays and Clay Minerals
Issue number2
StatePublished - 1997


  • Copper inclusions
  • Illite
  • Native copper
  • Transmission electron microscopy (TEM)
  • Weathering

ASJC Scopus subject areas

  • Water Science and Technology
  • Soil Science
  • Geochemistry and Petrology
  • Earth and Planetary Sciences (miscellaneous)

Cite this