Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards?

G. Tamizhmani; S. Radhakrishnan; B. Shisler

doi:10.1109/PVSC.2014.6925622

Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards?

G. Tamizhmani, S. Radhakrishnan, B. Shisler

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

It is well recognized by the consumers and financial communities that the nameplate tolerance limit needs to be tightened. However, it is not known what is the practically acceptable lower limit to address the limitations of manufacturers, testing labs and standards developing communities. This paper aims to provide a data-driven objective evidence to support tightening the nameplate rating tolerance so the industry and standards developing organizations may consider requiring a lower nameplate tolerance. The independently measured Pmax data of thousands of modules, between 1997 and 2013, have been statistically analyzed to determine an acceptable lower limit for the nameplate tolerance. This extensive statistical analysis, based on the statistically significant number of modules, clearly indicates that the nameplate tolerance of less than 5% can easily be achieved by the manufacturers and is recommended to be included in the rating tolerance and pass/fail test standards.

Original language	English (US)
Title of host publication	2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	3226-3229
Number of pages	4
ISBN (Electronic)	9781479943982
DOIs	https://doi.org/10.1109/PVSC.2014.6925622
State	Published - Oct 15 2014
Externally published	Yes
Event	40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States Duration: Jun 8 2014 → Jun 13 2014

Publication series

Name	2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Other

Other	40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Country/Territory	United States
City	Denver
Period	6/8/14 → 6/13/14

Keywords

EN 50380
IEC 61215
UL 4730
nameplate rating
tolerance

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/PVSC.2014.6925622

Cite this

Tamizhmani, G., Radhakrishnan, S., & Shisler, B. (2014). Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 3226-3229). Article 6925622 (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6925622

Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? / Tamizhmani, G.; Radhakrishnan, S.; Shisler, B.
2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 3226-3229 6925622 (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tamizhmani, G, Radhakrishnan, S & Shisler, B 2014, Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? in 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014., 6925622, 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, Institute of Electrical and Electronics Engineers Inc., pp. 3226-3229, 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, United States, 6/8/14. https://doi.org/10.1109/PVSC.2014.6925622

Tamizhmani G, Radhakrishnan S, Shisler B. Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 3226-3229. 6925622. (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). doi: 10.1109/PVSC.2014.6925622

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Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards?

Abstract

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Keywords

ASJC Scopus subject areas

Access to Document

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