@inproceedings{c589863ec9be4c68967545da0c58ffbe,
title = "THz on-wafer calibration using offset-shorts and known through as standards",
abstract = "We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.",
keywords = "millimeter waves, on-wafer measurements, sub-millimeter waves, terahertz",
author = "Cosan Caglayan and Trichopoulos, \{Georgios C.\} and Kubilay Sertel",
year = "2015",
month = feb,
day = "19",
doi = "10.1109/NAECON.2014.7045823",
language = "English (US)",
series = "National Aerospace and Electronics Conference, Proceedings of the IEEE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "308--309",
booktitle = "2014 IEEE National Aerospace and Electronics Conference, NAECON 2014",
note = "IEEE National Aerospace and Electronics Conference, NAECON 2014 ; Conference date: 24-06-2014 Through 27-06-2014",
}